¹û¶³´«Ã½

Conference papers

1. Whitehouse D J and Archard J F 1969 ‘The properties of random surfaces in contact’ ASME Conf on surface mechanics, Los Angeles, p36-57
2. Whitehouse D J 1972 ‘Modern methods of assessing the quality and function of surfaces’ SME Creative Engineering, paper IQ.72-206
3. Whitehouse D J 1973 ‘Review of topography of machined surfaces’ Proc Int Conf on Surface Technology, SME, Pittsburgh, May P53-73
4. Jungles J, Goodwin E and Whitehouse D J, 1974 ‘Advances in electro-optical techniques for describing engineering surfaces ‘Proceedings Electro-Optics Instrumentation Brighton p 324-334
5. Whitehouse D J and Jungles J, 1974 ‘Some modern methods of evaluating surfaces’ Proceedings of International Conf on Prod Engineering Tokyo Vol 2 p 1-9
6. Whitehouse D J 1974 ‘Modern trends in the measurement of surfaces’ Internat Conf on Manufacturing, Inst Prod Engrs, Olympia London, October 3rd
7. King T G Stout K J and Whitehouse D J 1977 ‘Surface metrology-Its relevance in a wear environment ‘1st Joint Polytechnic Symposium on manufacturing engineering, Leicester Paper C1 p 1-11
8. Whitehouse D J 1974 ‘Some ultimate limits of measuring surfaces using stylus techniques ‘ Proc Jap Soc Prec. Engrs
9. Whitehouse D J 1977 ‘The specification and measurement of surface texture and its relevance ‘ASME Conference on Gears and Cams, Detroit ,June, paper 14(KN)
10. Whitehouse D J 1980 ‘In process surface measurement and the computer control of manufacturing process’ Int Conf System Engineering, Sept . Lanchester Polytechnic
11. Whitehouse D J 1981 ‘Use of computers in measurement and assessment of ball bearing cross tracks and rings’ Potshipniki 81 paper 22 Moscow (In Russian)
12. Miyamoto I, Kawata K Davies S T and Whitehouse D J 1987 ‘Surface topography of a steel gauge block bombarded with Nitrogen ion beams’ Conference IPAT (Ion and Plasma Assisted Techniques). Brighton UK May
13. Whitehouse D J 1987 ‘High precision assessment of multi-processes’ Gosstandard Conference Moscow paper no 21 (In Russian)
14. Whitehouse D J 1987 ‘Calibration of fine surfaces’ VNIMS Conference on Calibration, Leningrad paper 30 Sept.(24p) (in Russian)
15. Whitehouse D J 1988 ‘Developments in instrumentation for quality control surface geometry at the point of manufacture’ 32nd Conference EOQC paper 8C.3 Moscow p 649-653
16. Wang W L and Whitehouse D J 1996 ‘Open loop control of piezo electric actuators using neural networks’ Proc Eng *th IPES Compiegne France.
17. Whitehouse D J and Graca M S 1997 ‘Surface metrology and performance’ Proc 4th Int Colloquium Micro-und Nanotechnologie Vienna Technical University ISBN 3-901888-00-4 p 147-150(KN)
18. Whitehouse D J 1997 ‘Condition monitoring of manufacture using surface topography’ Proc 3rd Int Conf Lamda Map, J Computational Methods Vol 14 (3) July ISBN 1-85312536-9 (KN)
19. Whitehouse D J 1998 ‘Process and quality control using surface finish’ 6th ISMQC IMEKO Vienna ISBN 3-901888020 (KN)
20. Huang T Wang J S and 1998 ‘Closed form solution to Stewart parallel maniplulators’ Proc ASME Biennial Conf DETC98/MECH-6001 P 32-40
21. Chang A Y and Whitehouse D J 1998 ‘Revised entropy approach to the measurement of manufacturing fidelity’ Proc 5th Joint Conf on Automatic technique, Automation 98 Taipai, P 560-571 (no copy)
22. Whitehouse D J 1998 ‘Surface metrology and its relevance to mechatronics’ Proc 2nd Int Conf Mechatronics, Hsinchu Taiwan P 471-476 (KN)
23. Whitehouse D J 1998 ‘Advances in metrology’ !8th all India Conference on manufacturing Technology, Calcutta, Kharagpur, p 87- 99 (KN) (no copy)
24. Whitehouse D J 1999 ‘Characterizing the machined surface condition by appropriate parameters’ Pro 3rd Int Conf On Industrial tooling Southampton Sept P 8-31 (KN)
25. Trumpold H Hutley M Held E and Whitehouse D J 1999 ‘Calibration of stylus instruments down to nanometric range using sinusoidal calibration standards’ 1st meeting Euspen Bremen (6p) (no copy)
26. Chang A-Y and Whitehouse D J 1999 ‘An attributed scheme of manufacturing systems flexibility’ Proc 9th Int Conf Flexible Automation and Intelligent Manufacture’ Tilberg Netherlands June p 161-166
27. Chang A-Y and Whitehouse D J 1999 ‘On the measurement of group flexibility’ Proc 11th Nat Conf on Automatic Science and Technology Taiwan July p 236-243 (no copy)
28. Whitehouse D J 1999 ‘Surfaces in nanotechnology’ 4th Int Conf on Electronic Measurement and Instruments (ICEMI) Harbin Inst of Technology PR China August p 215-230 (KN)
29. Whitehouse D J 1999 ‘Surface metrology of bearings’ Int Coop Symposium on Quality Assurance by Measurement Technology and Image Processing’ Steyr Austria vol 3 p 1-6 (KN)
30. Whitehouse D J 1999 ‘Stylus and/or optical methods for surface metrology’ Int Coop Symposium on Quality Assurance by Measurement Technology and Image Processing’ Steyr Austria vol 3 p 7-22 (KN)
31. Whitehouse D J 1999 ‘Surface measurement fidelity using laser metrology’ Proc 4th Conf on Laser Metrology and Machine Performance’ Lamda Map Newcastle July p 267-276
32. Whitehouse D J 1999 ‘Index of fidelity’ ‘ISIST 99’ 1st Int Symp on Science and Technology, Lyouang, PR China, August p 23-26 (KN) (no copy)
33. Whitehouse D J 2000 ‘Surface Metrology’ Copen 2000 1st All India Conference on Precision Engineering Chennai ISBN 81-7319-351-7 p 1-24 (KN)
34. Whitehouse D J 2000 ‘Surfaces and function‘ Feinstbearbertung. Technische Oberflachen %th Int Conf IWF Kolloquium ETH Zurich ISBN 3-901888-02-0 (KN)
35. Whitehouse D J 2000 ‘Function maps and the role of surfaces’ 8th Conf on Geometry and properties of surfaces Huddersfield April p 2-18 (KN)
36. Whitehouse D J 2000 ‘Dual function-surface metrology’ XVI IMEKO World Congress, Sept . Vienna, Proc Vol 14 P 321-334 ISBN 3-901888-03-9(KN)
37. Whitehouse D J 2000 ‘Surface finish of dies and moulds’ Osaka Japan April ISBN 1-853126616 9KN)(no copy)
38. Whitehouse D J 2000 ‘Surfaces-function characterization’ Euspen International Seminar ¹û¶³´«Ã½ Sept p 92-110 ISBN i-861940637
39. Huang T Jiang B and Whitehouse D J ‘Determination of carriage stroke of 6-PSS parallel manipulators having the specific orientation in a prescribed workspace’ Proc IEEE Int. Conf Robotics and Automation, San Fransisco April Vol 3 P 2382-2385 (EI)
40. Whitehouse D J 2002 ‘Theoretical aspects of surface nanometrology‘ 2nd Int. Symposium. on Science and Technology Jinan China Aug 18-22 p 1-15 ISBN 7-5603-1768-5(KN)
41. Whitehouse D J 2003 ‘Some topics in surface and nanometrology’ Conf Optical Metrology – Optical measurement systems, Munich Proc SPIE 5144 p 435-442(KN)
42. Whitehouse D J 2003 ‘Machined roundness in precision engineering’ 5th Int Conf Industrial tooling, Southampton Sept 10-11 (KN)
43. Whitehouse D J 2003 ‘Progress in nanometrology’ ICOPE Int Conf on Prec Eng., Singapore ISBN 981-04-8484-4 P xii (KN)
44. Whitehouse D J 2004 ‘Dynamics, measurement and characteristics of small objects and features’ 3rd Int Symp on Instrumentation and Technology, Xi’an China p 17-28 (KN)
45. Whitehouse D J 2005 ‘Precision machining; surface and nanometrology’ ICPM 3rd Int Congress on Precision Machining, Vienna University, Oct 18-19 p 1-13 (KN)
46. Whitehouse D J 2008 ‘Surface metrology for control of manufacture’ Proc 8th Int Conf on frontiers of Design and Manufacture Tianjin China Sept 23-26 p ?
47. Whitehouse D J 2013 ‘Changes in the Attributes and Metrology of Surface Metrology’ ASPEN 2013 Tapei, Taiwan (KN)
48. Yu Y, Whitehouse D J 2013 ‘Advanced Metrology Tools for assessing micro-optical lenses with structured surfaces’ ASPEN 2013 Taipei, Taiwan

Seminars

1. Whitehouse D J 1975 ‘Modern trends in the measurement of surfaces – surface metrology‘Proc Seminaro Sobre Metrologia Dimesional ‘Madrid p 1-34.
2. Whitehouse D J 1975 ‘Surface texture assessment errors of finishing processes caused by skid distortion’ Seminar on metrology, University of Prague Engineering.
3. Whitehouse D J 1975 ‘Some aspects of modern instrumentation‘ Taylor Hobson Seminar, Des Plaines, Chicago.
4. Whitehouse D J 1978 ‘Surface texture measurement’ British Gear Makers Conference London May(KN).
5. Whitehouse D J 1978 ‘Assessment of manufactured surfaces using modern techniques‘ Rank Organisation London Paper 1 p 1-21.
6. Phillips M J and Whitehouse D J 1979 ‘Truncated random variables with application to random surfaces ‘ISO Gosstandart Moscow Tech Note Me-1.
7. Whitehouse D J and Phillips M J 1979 ‘Three dimensional peaks determined by digital analysis’ ISO Gosstandard, Moscow Doc 2- 79.
8. Whitehouse D J 1980 ‘The application of minis and micros to surface metrology ‘BNCS 14th Annual Tech Conf ‘Towards Integrated Manufacture’ April- British Numerical Control Society Birmingham(KN).
9. Whitehouse D J 1982 ‘Innovation transfer university research and industrial development’ BTR Conference, Jan, Birmingham.
10. Whitehouse D J 1981 ‘Random process analysis in surface metrology’ IEE Colloquium 17.9.81 /56 London(KN).
11. Whitehouse D J and Phillips M J 1981 ‘The assessment of engineering surfaces using random process analysis SRC Vac School Stochastic Processes in Control Systems ¹û¶³´«Ã½ University March.
12. Whitehouse D J 1987 ‘Surface texture and its relevance in de-contaminability’ British Nuclear Fuels Symposium Risley Technical report T Me 61 (KN).
13. Whitehouse D J 1984 ‘Recent advances in measurement technology’ Conference on quality control’ University of Prague, Paper31 P 21-37.
14. Whitehouse D J 1986 ‘In process gauging for cost reduction’ Inst Prod Engrg Seminar Birmingham University paper 2 P 1-15.
15. Whitehouse D J 1983 ‘Metrology’ SERC Vacation school Chapter 12 ¹û¶³´«Ã½ University P 1-11.
16. Whitehouse D J 1988 ‘Present and future problems in metrology’ Ist Seminar on Nano-technology Centre for Microengineering and Metrology and Tokyo Science University(KN).
17. Whitehouse D J 1986 ‘Surfaces in nanometrology’ ISIST Harbin P R China.
18. Whitehouse D J 1986 ‘Digital analysis of two dimensional surfaces’ InT Conf Modern production and Production Metrology, Technische Universitat, Wien, Osterreich April.
19. Whitehouse D J 1991 ‘Nanotechnology instrumentation’ Vortagsreibe Integrierte Micro Systeme und ihre Anwendungen April - Neu Tecnikum Buchs (KN).
20. Whitehouse D J and flower J O 1992 ‘Surface geometry nanometric trends in characterisation and measurement’ 3rd Bienniel Symposium on Nanotechnology Between Tokyo Science University and ¹û¶³´«Ã½.
21. Whitehouse D J 1993 ‘Future trends for instrumentation for nanotechnology Symposium Oxford UBM Messtechnik.
22. Whitehouse D J 1993’ Entwcklungstendenzen der instrumentierung fur die nanotechnology’ Seminar Nanotechnology University of Vienna Institut Fur Fertigungstechnik.
23. Whitehouse D J 1994 ‘Modern advances in instrumentation for metrology’ Dept Applied Electronics Sept, Science Univ. Tokyo.
24. Whitehouse D J 1997 ‘Surface metrology and bearings’ Chinese Inst Mech Eng Colloquium On Bearings Beijing.
25. Whitehouse D J 1997 ‘Nanotechnology’ Int Conf Nano technology and precision Instrument Development, Tshinoi, Taiwan. 26 Whitehouse D J 2000 ‘Role of surface metrology in quality control’ 6th Joint ¹û¶³´«Ã½ /Tokyo Science University nanotechnology Symposium Sept p 13-18 (KN). 27 Whitehouse D J 2001 ‘Surface metrology and nanometrology’ Seminar Dept Mech Eng University of Connecticut Jan 21-24 (no copy).
26. Whitehouse D J 2001 ‘Standardization in Metrology’ NCSL Standards of Canada Toronto April 2-6 (no copy)(KN).
27. Whitehouse D J 2001 ‘Quality control’ Seminar Jap Society of Quality Control, Tokyo Oct 21-23 (no copy).
28. Whitehouse D J 2001 ‘Surfaces and mechatronics’ Jap Mechatronics Seminar Nagoya Oct 18-20(no copy).
29. Whitehouse D J 2001 ‘Role of Surfaces’ Metalex Conference and exhibition, Bangkok Nov 7-Theoretical aspects of Surface Nanometrology 29 (no copy).
30. Whitehouse D J 2005 ‘History and future prospects in the field of measurement and instrumentation’ EPSRC Life Lectures University of Huddersfield Sept.
31. Whitehouse D J 2009 ‘Surface metrology today’ Symposium AHMT Bremen University Sept 17-19 (KN).
32. Whitehouse D J 2010 ‘Surfaces Their Properties and Measurement’ Ametek Seminar Tokyo {(in Japanese).

Films

• D J Whitehouse - Eight Surface Metrology professional tutorial films for Eastman Kodak, Rochester, New York USA .